Arima PV&O has been focusing on development of single- and multi-junction III-V solar cells since year 2007.
Our goal is to become a major supplier providing high C/P value and reliable solar cells for terrestrial, space and consumer applications.
Maximum triple junction (TJ) cell efficiency under concentrated suns reaches 42%.
Average TJ cell efficiency in production exceeds 39.5%.
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Single Junction GaAs Solar Cell
1. Front and back contacts are weldable or solderable
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2. Cells are fully tested under AM1.5D illumination -
Triple Junction Solar Cell (InGaP/InGaAs/Ge)
1. Front and back contacts are weldable or solderable
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2. Cells are fully tested under concentrated illumination -
Space solar cell
1. Triple junction solar cell (InGaP/InGaAs/Ge)
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2. Front and back contacts are weldable or solderable.
3. Cells are 100% tested under AM0 illumination -
Triple Junction Concentrator Solar Cell Epiwafer
1. Growth by MOCVD tech.
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2. High efficiency, triple junction solar cell, with n-on-p polarity on Ge substrate -
Arima HCPV System Installations
1. Has been certified by International
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Electrotechnical Commission (IEC)
2. Has constructed numerous HCPV facilities -
Photolithography process area
Class 1,000 yellow room equipped with photo-resist spray coater, mask aligner, photo-developer, oven, spin dryer and hot N2 dryer.
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Epiwafer size processed is from 2- to 6-inch . -
Wet chemical station area
Equipment including acid wet bench, alkaline wet bench, organic clean wet bench and photo-resist strip bench.
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Thin metallization film area
Equipment including two E-beam evaporators for contact metallization and a rapid thermal anneal (RTA) set-up for contact annealing.
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Thickness uniformity is well controlled.
Evaporation angle is also well controlled. Front metal gridline profile is >80 degrees. -
Saw dicing area
High-speed rotated diamond dicing equipments are used for saw dicing.
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Dicing width and depth are well controlled.
Chipping and breakage have been reduced to very minimal.
Heat generated from dicing is reduced by in-situ water cooling system. -
Cell testing area
Solar simulator is utilized for measuring optical-electrical transfer efficiency on wafer, chip and sub-mount level.
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The concentration ratio of simulator can be adjusted from 1- to 2,000-suns.
Quantum efficiency (QE) measurement set-up is used to measure cell QE from 300 nm to 1800 nm spectral wavelengths. -
MOCVD epitaxial growth area
Arima PV&O utilizes MOCVD technology to grow epitaxial wafers.
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Standard wafer size is 4-inch. Other wafer sizes including 2 inch, 3 inch and 6 inch are also available.
Arima PV&O’s standard epitaxial products are
GaInP/InGaAs/Ge triple junction solar epi wafers,
GaInP/GaAs dual junction solar epi wafers and
GaAs single junction solar epi wafers.
Other customized epi wafer is also available upon request.